Redox characterization of semiconductors based on electrochemical measurements combined with UV-Vis diffuse reflectance spectroscopy

2013
journal article
article
32
dc.affiliationWydział Chemii : Zakład Chemii Nieorganicznejpl
dc.contributor.authorŚwiętek, Elżbieta - 126366 pl
dc.contributor.authorPilarczyk, Kacperpl
dc.contributor.authorDerdzińska, Justynapl
dc.contributor.authorSzaciłowski, Konrad - 132185 pl
dc.contributor.authorMacyk, Wojciech - 130162 pl
dc.date.accessioned2015-06-08T09:25:28Z
dc.date.available2015-06-08T09:25:28Z
dc.date.issued2013pl
dc.description.admin[AB] Derdzińska, Justyna 50000141pl
dc.description.admin[AB] Szaciłowski, Konrad [SAP11115985] 50000141pl
dc.description.number34pl
dc.description.physical14256-14261pl
dc.description.volume15pl
dc.identifier.doi10.1039/C3CP52129Jpl
dc.identifier.eissn1463-9084pl
dc.identifier.issn1463-9076pl
dc.identifier.urihttp://ruj.uj.edu.pl/xmlui/handle/item/8948
dc.languageengpl
dc.language.containerengpl
dc.rights.licencebez licencji
dc.subtypeArticlepl
dc.titleRedox characterization of semiconductors based on electrochemical measurements combined with UV-Vis diffuse reflectance spectroscopypl
dc.title.journalPhysical Chemistry Chemical Physicspl
dc.typeJournalArticlepl
dspace.entity.typePublication
dc.affiliationpl
Wydział Chemii : Zakład Chemii Nieorganicznej
dc.contributor.authorpl
Świętek, Elżbieta - 126366
dc.contributor.authorpl
Pilarczyk, Kacper
dc.contributor.authorpl
Derdzińska, Justyna
dc.contributor.authorpl
Szaciłowski, Konrad - 132185
dc.contributor.authorpl
Macyk, Wojciech - 130162
dc.date.accessioned
2015-06-08T09:25:28Z
dc.date.available
2015-06-08T09:25:28Z
dc.date.issuedpl
2013
dc.description.adminpl
[AB] Derdzińska, Justyna 50000141
dc.description.adminpl
[AB] Szaciłowski, Konrad [SAP11115985] 50000141
dc.description.numberpl
34
dc.description.physicalpl
14256-14261
dc.description.volumepl
15
dc.identifier.doipl
10.1039/C3CP52129J
dc.identifier.eissnpl
1463-9084
dc.identifier.issnpl
1463-9076
dc.identifier.uri
http://ruj.uj.edu.pl/xmlui/handle/item/8948
dc.languagepl
eng
dc.language.containerpl
eng
dc.rights.licence
bez licencji
dc.subtypepl
Article
dc.titlepl
Redox characterization of semiconductors based on electrochemical measurements combined with UV-Vis diffuse reflectance spectroscopy
dc.title.journalpl
Physical Chemistry Chemical Physics
dc.typepl
JournalArticle
dspace.entity.type
Publication

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