Extracting information from partially depleted Si detectors with digital sampling electronics

doi:10.1051/epjconf/20158801013

Extracting information from partially depleted Si detectors with digital sampling electronics

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Extracting information from partially depleted Si detectors with digital sampling electronics

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title:	Extracting information from partially depleted Si detectors with digital sampling electronics
author:	Pastore G., Pasquali G., Le Neindre N., Ademard G., Barlini S., Bini M., Bonnet E., Borderie B., Bougault R., Casini G., Chbihi A., Cinausero M., Dueñas J. A., Edelbruck P., Frankland J. D., Gramegna F., Gruyer D., Kordyasz A., Kozik Tomasz , Lopez O., Marchi T., Morelli L., Olmi A., Ordine A., Pârlog M., Piantelli S., Poggi G., Rivet M.-F., Rosato E., Salomon F., Spadaccini G., Stefanini A. A., Valdré S., Vient E., Twaróg Tomasz , Alba R., Maiolino C., Santonocito D.
journal title:	EPJ Web of Conferences
title of volume:	IWM-EC 2014 – International Workshop on Multi facets of EoS and Clustering, Catania, Italy, May 6-9, 2014
volume:	88
date of publication :	2015
article ID:	01013
ISSN:	2101-6275
eISSN:	2100-014X
DOI:	10.1051/epjconf/20158801013
language:	English
journal language:	English
abstract in English:	A study of the identification properties and of the energy response of a Si-Si-CsI(Tl) $\Delta$ E-E telescope exploiting a partially depleted second Si stage has been performed. Five different bias voltages have been applied to the second stage of the telescope, one corresponding to full depletion, the others associated with a depleted layer ranging from 60% to 90% of the detector thickness. Fragment identification has been obtained using either the $\Delta$E-E technique or the Pulse Shape Analysis (PSA). Charge collection efficiency has been evaluated. The $\Delta$ E-E performance is not affected by incomplete depletion. Isotopic separation capability improves at lower bias voltages with respect to full depletion, though charge identification thresholds increase.
number of pulisher's sheets:	0,3
conference:	International Workshop on Multi facets of Eos and Clustering IWM-EC 2014; 2014-05-06; 2014-05-09; Katania; Włochy; indeksowana w Web of Science; indeksowana w Scopus; ;
affiliation:	Wydział Fizyki, Astronomii i Informatyki Stosowanej : Instytut Fizyki im. Mariana Smoluchowskiego
type:	journal article
subtype:	conference proceedings