Extracting information from partially depleted Si detectors with digital sampling electronics

2015
journal article
conference proceedings
cris.lastimport.wos2024-04-09T21:18:02Z
dc.abstract.enA study of the identification properties and of the energy response of a Si-Si-CsI(Tl) $\Delta$ E-E telescope exploiting a partially depleted second Si stage has been performed. Five different bias voltages have been applied to the second stage of the telescope, one corresponding to full depletion, the others associated with a depleted layer ranging from 60% to 90% of the detector thickness. Fragment identification has been obtained using either the $\Delta$E-E technique or the Pulse Shape Analysis (PSA). Charge collection efficiency has been evaluated. The $\Delta$ E-E performance is not affected by incomplete depletion. Isotopic separation capability improves at lower bias voltages with respect to full depletion, though charge identification thresholds increase.pl
dc.affiliationWydział Fizyki, Astronomii i Informatyki Stosowanej : Instytut Fizyki im. Mariana Smoluchowskiegopl
dc.conferenceInternational Workshop on Multi facets of Eos and Clustering IWM-EC 2014
dc.conference.cityKatania
dc.conference.countryWłochy
dc.conference.datefinish2014-05-09
dc.conference.datestart2014-05-06
dc.conference.indexscopustrue
dc.conference.indexwostrue
dc.contributor.authorPastore, G.pl
dc.contributor.authorPasquali, G.pl
dc.contributor.authorLe Neindre, N.pl
dc.contributor.authorAdemard, G.pl
dc.contributor.authorBarlini, S.pl
dc.contributor.authorBini, M.pl
dc.contributor.authorBonnet, E.pl
dc.contributor.authorBorderie, B.pl
dc.contributor.authorBougault, R.pl
dc.contributor.authorCasini, G.pl
dc.contributor.authorChbihi, A.pl
dc.contributor.authorCinausero, M.pl
dc.contributor.authorDueñas, J. A.pl
dc.contributor.authorEdelbruck, P.pl
dc.contributor.authorFrankland, J. D.pl
dc.contributor.authorGramegna, F.pl
dc.contributor.authorGruyer, D.pl
dc.contributor.authorKordyasz, A.pl
dc.contributor.authorKozik, Tomasz - 129362 pl
dc.contributor.authorLopez, O.pl
dc.contributor.authorMarchi, T.pl
dc.contributor.authorMorelli, L.pl
dc.contributor.authorOlmi, A.pl
dc.contributor.authorOrdine, A.pl
dc.contributor.authorPârlog, M.pl
dc.contributor.authorPiantelli, S.pl
dc.contributor.authorPoggi, G.pl
dc.contributor.authorRivet, M.-F.pl
dc.contributor.authorRosato, E.pl
dc.contributor.authorSalomon, F.pl
dc.contributor.authorSpadaccini, G.pl
dc.contributor.authorStefanini, A. A.pl
dc.contributor.authorValdré, S.pl
dc.contributor.authorVient, E.pl
dc.contributor.authorTwaróg, Tomasz - 106840 pl
dc.contributor.authorAlba, R.pl
dc.contributor.authorMaiolino, C.pl
dc.contributor.authorSantonocito, D.pl
dc.date.accessioned2016-03-16T13:38:27Z
dc.date.available2016-03-16T13:38:27Z
dc.date.issued2015pl
dc.date.openaccess0
dc.description.accesstimew momencie opublikowania
dc.description.conftypeinternationalpl
dc.description.publication0,3pl
dc.description.versionostateczna wersja wydawcy
dc.description.volume88pl
dc.identifier.articleid01013pl
dc.identifier.doi10.1051/epjconf/20158801013pl
dc.identifier.eissn2100-014Xpl
dc.identifier.issn2101-6275pl
dc.identifier.projectROD UJ / Ppl
dc.identifier.urihttp://ruj.uj.edu.pl/xmlui/handle/item/22501
dc.languageengpl
dc.language.containerengpl
dc.rightsUdzielam licencji. Uznanie autorstwa 4.0 Międzynarodowa*
dc.rights.licenceCC-BY
dc.rights.urihttp://creativecommons.org/licenses/by/4.0/legalcode.pl*
dc.share.typeotwarte czasopismo
dc.subtypeConferenceProceedingspl
dc.titleExtracting information from partially depleted Si detectors with digital sampling electronicspl
dc.title.journalEPJ Web of Conferencespl
dc.title.volumeIWM-EC 2014 – International Workshop on Multi facets of EoS and Clustering, Catania, Italy, May 6-9, 2014pl
dc.typeJournalArticlepl
dspace.entity.typePublication
cris.lastimport.wos
2024-04-09T21:18:02Z
dc.abstract.enpl
A study of the identification properties and of the energy response of a Si-Si-CsI(Tl) $\Delta$ E-E telescope exploiting a partially depleted second Si stage has been performed. Five different bias voltages have been applied to the second stage of the telescope, one corresponding to full depletion, the others associated with a depleted layer ranging from 60% to 90% of the detector thickness. Fragment identification has been obtained using either the $\Delta$E-E technique or the Pulse Shape Analysis (PSA). Charge collection efficiency has been evaluated. The $\Delta$ E-E performance is not affected by incomplete depletion. Isotopic separation capability improves at lower bias voltages with respect to full depletion, though charge identification thresholds increase.
dc.affiliationpl
Wydział Fizyki, Astronomii i Informatyki Stosowanej : Instytut Fizyki im. Mariana Smoluchowskiego
dc.conference
International Workshop on Multi facets of Eos and Clustering IWM-EC 2014
dc.conference.city
Katania
dc.conference.country
Włochy
dc.conference.datefinish
2014-05-09
dc.conference.datestart
2014-05-06
dc.conference.indexscopus
true
dc.conference.indexwos
true
dc.contributor.authorpl
Pastore, G.
dc.contributor.authorpl
Pasquali, G.
dc.contributor.authorpl
Le Neindre, N.
dc.contributor.authorpl
Ademard, G.
dc.contributor.authorpl
Barlini, S.
dc.contributor.authorpl
Bini, M.
dc.contributor.authorpl
Bonnet, E.
dc.contributor.authorpl
Borderie, B.
dc.contributor.authorpl
Bougault, R.
dc.contributor.authorpl
Casini, G.
dc.contributor.authorpl
Chbihi, A.
dc.contributor.authorpl
Cinausero, M.
dc.contributor.authorpl
Dueñas, J. A.
dc.contributor.authorpl
Edelbruck, P.
dc.contributor.authorpl
Frankland, J. D.
dc.contributor.authorpl
Gramegna, F.
dc.contributor.authorpl
Gruyer, D.
dc.contributor.authorpl
Kordyasz, A.
dc.contributor.authorpl
Kozik, Tomasz - 129362
dc.contributor.authorpl
Lopez, O.
dc.contributor.authorpl
Marchi, T.
dc.contributor.authorpl
Morelli, L.
dc.contributor.authorpl
Olmi, A.
dc.contributor.authorpl
Ordine, A.
dc.contributor.authorpl
Pârlog, M.
dc.contributor.authorpl
Piantelli, S.
dc.contributor.authorpl
Poggi, G.
dc.contributor.authorpl
Rivet, M.-F.
dc.contributor.authorpl
Rosato, E.
dc.contributor.authorpl
Salomon, F.
dc.contributor.authorpl
Spadaccini, G.
dc.contributor.authorpl
Stefanini, A. A.
dc.contributor.authorpl
Valdré, S.
dc.contributor.authorpl
Vient, E.
dc.contributor.authorpl
Twaróg, Tomasz - 106840
dc.contributor.authorpl
Alba, R.
dc.contributor.authorpl
Maiolino, C.
dc.contributor.authorpl
Santonocito, D.
dc.date.accessioned
2016-03-16T13:38:27Z
dc.date.available
2016-03-16T13:38:27Z
dc.date.issuedpl
2015
dc.date.openaccess
0
dc.description.accesstime
w momencie opublikowania
dc.description.conftypepl
international
dc.description.publicationpl
0,3
dc.description.version
ostateczna wersja wydawcy
dc.description.volumepl
88
dc.identifier.articleidpl
01013
dc.identifier.doipl
10.1051/epjconf/20158801013
dc.identifier.eissnpl
2100-014X
dc.identifier.issnpl
2101-6275
dc.identifier.projectpl
ROD UJ / P
dc.identifier.uri
http://ruj.uj.edu.pl/xmlui/handle/item/22501
dc.languagepl
eng
dc.language.containerpl
eng
dc.rights*
Udzielam licencji. Uznanie autorstwa 4.0 Międzynarodowa
dc.rights.licence
CC-BY
dc.rights.uri*
http://creativecommons.org/licenses/by/4.0/legalcode.pl
dc.share.type
otwarte czasopismo
dc.subtypepl
ConferenceProceedings
dc.titlepl
Extracting information from partially depleted Si detectors with digital sampling electronics
dc.title.journalpl
EPJ Web of Conferences
dc.title.volumepl
IWM-EC 2014 – International Workshop on Multi facets of EoS and Clustering, Catania, Italy, May 6-9, 2014
dc.typepl
JournalArticle
dspace.entity.type
Publication
Affiliations

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