Non-contact atomic force microscopy studies of (2 × 4) InP(0 0 1) surface

2006
journal article
article
4
cris.lastimport.wos2024-04-09T21:33:56Z
dc.affiliationWydział Fizyki, Astronomii i Informatyki Stosowanej : Instytut Fizyki im. Mariana Smoluchowskiegopl
dc.contributor.authorSuch, Bartosz - 101122 pl
dc.contributor.authorKołodziej, Jacek - 129019 pl
dc.contributor.authorKrok, Franciszek - 100497 pl
dc.contributor.authorPiątkowski, Piotr - 100131 pl
dc.contributor.authorSzymoński, Marek - 132296 pl
dc.date.accessioned2021-01-05T11:46:48Z
dc.date.available2021-01-05T11:46:48Z
dc.date.issued2006pl
dc.description.number11pl
dc.description.physical2379-2384pl
dc.description.volume600pl
dc.identifier.doi10.1016/j.susc.2006.04.001pl
dc.identifier.eissn1879-2758pl
dc.identifier.issn0039-6028pl
dc.identifier.projectROD UJ / Opl
dc.identifier.urihttps://ruj.uj.edu.pl/xmlui/handle/item/259692
dc.languageengpl
dc.language.containerengpl
dc.rightsDodaję tylko opis bibliograficzny*
dc.rights.licencebez licencji
dc.rights.uri*
dc.subject.enindium phosphidepl
dc.subject.enInPpl
dc.subject.enIII-V semiconductorspl
dc.subject.ennon-contact atomic force microscopy, NCAFMpl
dc.subject.enatomic surface structurepl
dc.subject.ensurface reconstructionpl
dc.subtypeArticlepl
dc.titleNon-contact atomic force microscopy studies of (2 × 4) InP(0 0 1) surfacepl
dc.title.journalSurface Sciencepl
dc.typeJournalArticlepl
dspace.entity.typePublication
cris.lastimport.wos
2024-04-09T21:33:56Z
dc.affiliationpl
Wydział Fizyki, Astronomii i Informatyki Stosowanej : Instytut Fizyki im. Mariana Smoluchowskiego
dc.contributor.authorpl
Such, Bartosz - 101122
dc.contributor.authorpl
Kołodziej, Jacek - 129019
dc.contributor.authorpl
Krok, Franciszek - 100497
dc.contributor.authorpl
Piątkowski, Piotr - 100131
dc.contributor.authorpl
Szymoński, Marek - 132296
dc.date.accessioned
2021-01-05T11:46:48Z
dc.date.available
2021-01-05T11:46:48Z
dc.date.issuedpl
2006
dc.description.numberpl
11
dc.description.physicalpl
2379-2384
dc.description.volumepl
600
dc.identifier.doipl
10.1016/j.susc.2006.04.001
dc.identifier.eissnpl
1879-2758
dc.identifier.issnpl
0039-6028
dc.identifier.projectpl
ROD UJ / O
dc.identifier.uri
https://ruj.uj.edu.pl/xmlui/handle/item/259692
dc.languagepl
eng
dc.language.containerpl
eng
dc.rights*
Dodaję tylko opis bibliograficzny
dc.rights.licence
bez licencji
dc.rights.uri*
dc.subject.enpl
indium phosphide
dc.subject.enpl
InP
dc.subject.enpl
III-V semiconductors
dc.subject.enpl
non-contact atomic force microscopy, NCAFM
dc.subject.enpl
atomic surface structure
dc.subject.enpl
surface reconstruction
dc.subtypepl
Article
dc.titlepl
Non-contact atomic force microscopy studies of (2 × 4) InP(0 0 1) surface
dc.title.journalpl
Surface Science
dc.typepl
JournalArticle
dspace.entity.type
Publication

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