In this paper, we discuss different approaches for the estimation of transverse bunch characteristics, namely, tune and chromaticity, using Schottky-based diagnostics. In particular, we show how, depending on the signal quality and the availability of other instruments or information sources, we can choose appropriate strategies combining both spectrum fitting procedures and explicit parameter calculations. In addition, we revisit and formally derive the expression that relates the chromaticity with the width of the Schottky spectral sidebands, discussing the rigorous meaning of this width and in which conditions it can be applied. Results obtained using the proposed approaches are compared with the standard techniques for different fills in the LHC.