EBSD and TKD analyses using inverted contrast Kikuchi diffraction patterns and alternative measurement geometries

2024
journal article
article
3
dc.abstract.enElectron backscatter diffraction (EBSD) patterns can exhibit Kikuchi bands with inverted contrast due to anomalous absorption. This can be observed, for example, on samples with nanoscale topography, in case of a low tilt backscattering geometry, or for transmission Kikuchi diffraction (TKD) on thicker samples. Three examples are discussed where contrast-inverted physics-based simulated master patterns have been applied to find the correct crystal orientation. As first EBSD example, self-assembled gold nanostructures made of Au fcc and Au hcp phases on single-crystal germanium were investigated. Gold covered about 12% of the mapped area, with only two thirds being successfully interpreted using standard Hough-based indexing. The remaining third was solved by brute force indexing using a contrast-inverted master pattern. The second EBSD example deals with maps collected at a non-tilted surface instead of the commonly used 70° tilted one. As TKD example, a jet-polished foil made of duplex stainless steel 2205 was examined. The thin part close to the hole edge producing normal-contrast patterns were standard indexed. The areas of the foil that become thicker with increasing distance from the edge of the hole produce contrast-inverted patterns. They covered three times the evaluable area and were successfully processed using the contrast-inverted master pattern. In the last example, inverted patterns collected at a non-tiled sample were mathematically inverted to normal contrast, and Hough/Radon-based indexing was successfully applied.
dc.affiliationWydział Fizyki, Astronomii i Informatyki Stosowanej : Instytut Fizyki im. Mariana Smoluchowskiego
dc.contributor.authorCios, Grzegorz
dc.contributor.authorWinkelmann, Aimo
dc.contributor.authorNolze, Gert
dc.contributor.authorTokarski, Tomasz
dc.contributor.authorJany, Benedykt - 102112
dc.contributor.authorBała, Piotr
dc.date.accessioned2024-10-30T11:03:48Z
dc.date.available2024-10-30T11:03:48Z
dc.date.createdat2024-10-30T11:03:48Zen
dc.date.issued2024
dc.date.openaccess0
dc.description.accesstimew momencie opublikowania
dc.description.versionostateczna wersja wydawcy
dc.description.volume267
dc.identifier.articleid114055
dc.identifier.doi10.1016/j.ultramic.2024.114055
dc.identifier.doidataset10.5281/zenodo.10808975
dc.identifier.issn0304-3991
dc.identifier.urihttps://ruj.uj.edu.pl/handle/item/458467
dc.languageeng
dc.language.containereng
dc.rightsUdzielam licencji. Uznanie autorstwa - Użycie niekomercyjne - Bez utworów zależnych 4.0 Międzynarodowa
dc.rights.licenceCC-BY-NC-ND
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/4.0/legalcode.pl
dc.share.typeinne
dc.subject.enEBSD
dc.subject.enTKD
dc.subject.encontrast inversion
dc.subject.entopography
dc.subject.enKikuchi diffraction
dc.subtypeArticle
dc.titleEBSD and TKD analyses using inverted contrast Kikuchi diffraction patterns and alternative measurement geometries
dc.title.journalUltramicroscopy
dc.typeJournalArticle
dspace.entity.typePublicationen
dc.abstract.en
Electron backscatter diffraction (EBSD) patterns can exhibit Kikuchi bands with inverted contrast due to anomalous absorption. This can be observed, for example, on samples with nanoscale topography, in case of a low tilt backscattering geometry, or for transmission Kikuchi diffraction (TKD) on thicker samples. Three examples are discussed where contrast-inverted physics-based simulated master patterns have been applied to find the correct crystal orientation. As first EBSD example, self-assembled gold nanostructures made of Au fcc and Au hcp phases on single-crystal germanium were investigated. Gold covered about 12% of the mapped area, with only two thirds being successfully interpreted using standard Hough-based indexing. The remaining third was solved by brute force indexing using a contrast-inverted master pattern. The second EBSD example deals with maps collected at a non-tilted surface instead of the commonly used 70° tilted one. As TKD example, a jet-polished foil made of duplex stainless steel 2205 was examined. The thin part close to the hole edge producing normal-contrast patterns were standard indexed. The areas of the foil that become thicker with increasing distance from the edge of the hole produce contrast-inverted patterns. They covered three times the evaluable area and were successfully processed using the contrast-inverted master pattern. In the last example, inverted patterns collected at a non-tiled sample were mathematically inverted to normal contrast, and Hough/Radon-based indexing was successfully applied.
dc.affiliation
Wydział Fizyki, Astronomii i Informatyki Stosowanej : Instytut Fizyki im. Mariana Smoluchowskiego
dc.contributor.author
Cios, Grzegorz
dc.contributor.author
Winkelmann, Aimo
dc.contributor.author
Nolze, Gert
dc.contributor.author
Tokarski, Tomasz
dc.contributor.author
Jany, Benedykt - 102112
dc.contributor.author
Bała, Piotr
dc.date.accessioned
2024-10-30T11:03:48Z
dc.date.available
2024-10-30T11:03:48Z
dc.date.createdaten
2024-10-30T11:03:48Z
dc.date.issued
2024
dc.date.openaccess
0
dc.description.accesstime
w momencie opublikowania
dc.description.version
ostateczna wersja wydawcy
dc.description.volume
267
dc.identifier.articleid
114055
dc.identifier.doi
10.1016/j.ultramic.2024.114055
dc.identifier.doidataset
10.5281/zenodo.10808975
dc.identifier.issn
0304-3991
dc.identifier.uri
https://ruj.uj.edu.pl/handle/item/458467
dc.language
eng
dc.language.container
eng
dc.rights
Udzielam licencji. Uznanie autorstwa - Użycie niekomercyjne - Bez utworów zależnych 4.0 Międzynarodowa
dc.rights.licence
CC-BY-NC-ND
dc.rights.uri
http://creativecommons.org/licenses/by-nc-nd/4.0/legalcode.pl
dc.share.type
inne
dc.subject.en
EBSD
dc.subject.en
TKD
dc.subject.en
contrast inversion
dc.subject.en
topography
dc.subject.en
Kikuchi diffraction
dc.subtype
Article
dc.title
EBSD and TKD analyses using inverted contrast Kikuchi diffraction patterns and alternative measurement geometries
dc.title.journal
Ultramicroscopy
dc.type
JournalArticle
dspace.entity.typeen
Publication
Affiliations

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