Jagiellonian University Repository

Redox characterization of semiconductors based on electrochemical measurements combined with UV-Vis diffuse reflectance spectroscopy

Redox characterization of semiconductors based on ...

Show full item record

dc.contributor.author Świętek, Elżbieta [USOS1180] pl
dc.contributor.author Pilarczyk, Kacper pl
dc.contributor.author Derdzińska, Justyna pl
dc.contributor.author Szaciłowski, Konrad [SAP11115985] pl
dc.contributor.author Macyk, Wojciech [SAP11116781] pl
dc.date.accessioned 2015-06-08T09:25:28Z
dc.date.available 2015-06-08T09:25:28Z
dc.date.issued 2013 pl
dc.identifier.issn 1463-9076 pl
dc.identifier.uri http://ruj.uj.edu.pl/xmlui/handle/item/8948
dc.language eng pl
dc.title Redox characterization of semiconductors based on electrochemical measurements combined with UV-Vis diffuse reflectance spectroscopy pl
dc.type JournalArticle pl
dc.description.physical 14256-14261 pl
dc.description.volume 15 pl
dc.description.number 34 pl
dc.identifier.doi 10.1039/C3CP52129J pl
dc.identifier.eissn 1463-9084 pl
dc.title.journal Physical Chemistry Chemical Physics pl
dc.language.container eng pl
dc.affiliation Wydział Chemii : Zakład Chemii Nieorganicznej pl
dc.subtype Article pl
dc.rights.original bez licencji pl
dc.pbn.affiliation USOS1180:UJ.WCh; pl
.pointsMNiSW [2013 A]: 35


Files in this item

Files Size Format View

There are no files associated with this item.

This item appears in the following Collection(s)