Redox characterization of semiconductors based on electrochemical measurements combined with UV-Vis diffuse reflectance spectroscopy

Bibliographic description

punktacja MEiN [2013 A]: 35

title:	Redox characterization of semiconductors based on electrochemical measurements combined with UV-Vis diffuse reflectance spectroscopy
author:	Świętek Elżbieta , Pilarczyk Kacper, Derdzińska Justyna, Szaciłowski Konrad , Macyk Wojciech
journal title:	Physical Chemistry Chemical Physics
volume:	15
issue:	34
date of publication :	2013
pages:	14256-14261
ISSN:	1463-9076
eISSN:	1463-9084
DOI:	10.1039/C3CP52129J
language:	English
journal language:	English
affiliation:	Wydział Chemii : Zakład Chemii Nieorganicznej
type:	journal article
subtype:	academic paper

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