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Surface plasmon polariton dispersion relation at organic/dielectric/metal interfaces

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Surface plasmon polariton dispersion relation at organic/dielectric/metal interfaces

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dc.contributor.author Kostiučenko, Oksana pl
dc.contributor.author Fiutowski, Jacek pl
dc.contributor.author Kawalec, Tomasz [SAP11019840] pl
dc.contributor.author Bordo, Vladimir pl
dc.contributor.author Rubahn, Horst-Günter pl
dc.contributor.author Józefowski, Leszek [SAP11011561] pl
dc.date.accessioned 2015-05-19T10:29:06Z
dc.date.available 2015-05-19T10:29:06Z
dc.date.issued 2014 pl
dc.identifier.issn 0030-4018 pl
dc.identifier.uri http://ruj.uj.edu.pl/xmlui/handle/item/7421
dc.language eng pl
dc.rights Dodaję tylko opis bibliograficzny *
dc.rights.uri *
dc.title Surface plasmon polariton dispersion relation at organic/dielectric/metal interfaces pl
dc.type JournalArticle pl
dc.description.physical 77-81 pl
dc.abstract.en The dispersion relation of a hybrid photonic–plasmonic system consisting of a light emitting thin organic para-Hexaphenylene (p-6P) layer separated by a dielectric gap from a plasmonic silver film is investigated using leakage radiation spectroscopy. Experimental studies are complemented by numerical simulations for the same structure but in the complementary, inverted configuration. The numerical simulations use as input ellipsometric measurements providing optical constants of p-6P in a wide spectral range. From a comparison between calculated and measured dispersion curves it is concluded that the molecular excitons in the p-6P film, created in the course of ultraviolet illumination of the sample, are de-excited via excitation of a plasmonic mode of the metal film. pl
dc.subject.en leakage radiation spectroscopy pl
dc.subject.en ellipsometry pl
dc.subject.en dispersion relation pl
dc.subject.en surface plasmon polaritons pl
dc.description.volume 331 pl
dc.identifier.doi 10.1016/j.optcom.2014.05.058 pl
dc.identifier.eissn 1873-0310 pl
dc.title.journal Optics Communications pl
dc.language.container eng pl
dc.affiliation Wydział Fizyki, Astronomii i Informatyki Stosowanej : Instytut Fizyki im. Mariana Smoluchowskiego pl
dc.subtype Article pl
dc.rights.original bez licencji pl
.pointsMNiSW [2014 A]: 25


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