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Matrix effects in x-ray fluorescence holography : samples of arbitrary thickness

Matrix effects in x-ray fluorescence holography : ...

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dc.contributor.author Dul, Dawid [USOS62598] pl
dc.contributor.author Korecki, Paweł [SAP11015869] pl
dc.date.accessioned 2016-11-23T11:46:07Z
dc.date.available 2016-11-23T11:46:07Z
dc.date.issued 2016 pl
dc.identifier.issn 0942-9352 pl
dc.identifier.uri http://ruj.uj.edu.pl/xmlui/handle/item/32748
dc.language eng pl
dc.rights Dodaję tylko opis bibliograficzny *
dc.rights.uri *
dc.title Matrix effects in x-ray fluorescence holography : samples of arbitrary thickness pl
dc.type JournalArticle pl
dc.description.physical 457-470 pl
dc.abstract.en The influence of matrix effects i.e. beam attenuation (BA) and indirect excitation (IE) on local structure imaging with multiple-energy x-ray fluorescence holography is studied using computer simulations. An analytic formalism is developed which allows for the description of BA and IE when the thickness of the sample is arbitrary. It is shown that beyond the thin-sample approximation, in specific cases, the measured holograms cannot be treated as entirely element sensitive. Consequently, it is demonstrated that due to the reduction of element sensitivity, spurious maxima can arise in the holographic reconstruction which can be misinterpreted as atomic images. The proposed formalism allows one to analyse BA and IE and to correct for them. It opens way for quantitative interpretation of x-ray fluorescence holograms. pl
dc.description.volume 230 pl
dc.description.number 4 pl
dc.identifier.doi 10.1515/zpch-2015-0651 pl
dc.identifier.eissn 2196-7156 pl
dc.title.journal Zeitschrift für Physikalische Chemie pl
dc.language.container eng pl
dc.affiliation Wydział Fizyki, Astronomii i Informatyki Stosowanej : Instytut Fizyki im. Mariana Smoluchowskiego pl
dc.subtype Article pl
dc.rights.original bez licencji pl
.pointsMNiSW [2016 A]: 15


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