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Inversion layer on the Ge(001) surface from the four-probe conductance measurements

Inversion layer on the Ge(001) surface from the ...

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dc.contributor.author Wojtaszek, Mateusz [SAP13037778] pl
dc.contributor.author Lis, Jakub [SAP14002066] pl
dc.contributor.author Zuzak, Rafał [SAP14004865] pl
dc.contributor.author Such, Bartosz [SAP11017885] pl
dc.contributor.author Szymoński, Marek [SAP11006649] pl
dc.date.accessioned 2015-02-09T10:18:00Z
dc.date.available 2015-02-09T10:18:00Z
dc.date.issued 2014 pl
dc.identifier.issn 0003-6951 pl
dc.identifier.uri http://ruj.uj.edu.pl/xmlui/handle/item/2901
dc.language eng pl
dc.rights Dodaję tylko opis bibliograficzny *
dc.rights.uri *
dc.title Inversion layer on the Ge(001) surface from the four-probe conductance measurements pl
dc.type JournalArticle pl
dc.abstract.en We report four-probe conductance measurements with sub-micron resolution on atomically clean Ge(001) surfaces. A qualitative difference between n-type and p-type crystals is observed. The scaling behavior of the resistance on n-type samples indicates two-dimensional current flow, while for the p-type crystal a three-dimensional description is appropriate. We interpret this in terms of the formation of an inversion layer at the surface. This result points to the surface states, i.e., dangling bonds, as the driving force behind band bending in germanium. It also explains the intrinsic character of band bending in germanium. pl
dc.description.volume 105 pl
dc.description.number 4 pl
dc.description.publication 0,5 pl
dc.identifier.doi 10.1063/1.4891858 pl
dc.identifier.eissn 1077-3118 pl
dc.identifier.eissn 1520-8842 pl
dc.title.journal Applied Physics Letters pl
dc.language.container eng pl
dc.affiliation Wydział Fizyki, Astronomii i Informatyki Stosowanej : Instytut Fizyki im. Mariana Smoluchowskiego pl
dc.subtype Article pl
dc.identifier.articleid 042111 pl
dc.rights.original bez licencji pl
dc.pbn.affiliation USOS34446:UJ.WFAI; pl
.pointsMNiSW [2014 A]: 40

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