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Mixed MD simulation – analytical model analysis of Ag(111), C_{60} repetitive bombardment in the context of depth profiling for dynamic SIMS
Journal
Surface and Interface Analysis
20
Author
Paruch Robert
Garrison Barbara J.
Postawa Zbigniew
Title of volume
Special issue: Proceedings of the Eighteenth International Conference on Secondary Ion Mass Spectrometry, SIMS XVIII, Riva Del Garda, Trento, Italy, September 18-23, 2011
Volume
45
Issue
1
Pages
154-157
ISSN
0142-2421
eISSN
1096-9918
Keywords in English
cluster bombardment
dynamic SIMS
depth profiling
molecular dynamics
analytical model
Language
English
Container language
English
Affiliation
Wydział Fizyki, Astronomii i Informatyki Stosowanej : Instytut Fizyki im. Mariana Smoluchowskiego
| cris.lastimport.scopus | 2024-04-07T17:13:44Z | |
| dc.affiliation | Wydział Fizyki, Astronomii i Informatyki Stosowanej : Instytut Fizyki im. Mariana Smoluchowskiego | pl |
| dc.contributor.author | Paruch, Robert - 103655 | pl |
| dc.contributor.author | Garrison, Barbara J. | pl |
| dc.contributor.author | Postawa, Zbigniew - 100132 | pl |
| dc.date.accessioned | 2015-07-02T07:55:25Z | |
| dc.date.available | 2015-07-02T07:55:25Z | |
| dc.date.issued | 2013 | pl |
| dc.description.admin | [AB] Paruch, Robert J. | pl |
| dc.description.number | 1 | pl |
| dc.description.physical | 154-157 | pl |
| dc.description.volume | 45 | pl |
| dc.identifier.doi | 10.1002/sia.4940 | pl |
| dc.identifier.eissn | 1096-9918 | pl |
| dc.identifier.issn | 0142-2421 | pl |
| dc.identifier.uri | http://ruj.uj.edu.pl/xmlui/handle/item/11119 | |
| dc.language | eng | pl |
| dc.language.container | eng | pl |
| dc.rights | Dodaję tylko opis bibliograficzny | * |
| dc.rights.licence | bez licencji | |
| dc.rights.uri | * | |
| dc.subject.en | cluster bombardment | pl |
| dc.subject.en | dynamic SIMS | pl |
| dc.subject.en | depth profiling | pl |
| dc.subject.en | molecular dynamics | pl |
| dc.subject.en | analytical model | pl |
| dc.subtype | Article | pl |
| dc.title | Mixed MD simulation – analytical model analysis of Ag(111), C_{60} repetitive bombardment in the context of depth profiling for dynamic SIMS | pl |
| dc.title.journal | Surface and Interface Analysis | pl |
| dc.title.volume | Special issue: Proceedings of the Eighteenth International Conference on Secondary Ion Mass Spectrometry, SIMS XVIII, Riva Del Garda, Trento, Italy, September 18-23, 2011 | pl |
| dc.type | JournalArticle | pl |
| dspace.entity.type | Publication |
Affiliations
Wydział Fizyki, Astronomii i Informatyki Stosowanej
Postawa, Zbigniew
Paruch, Robert
No affiliation
Garrison, Barbara J.