Composition of PbTe oxides obtained by different methods

2014
journal article
article
cris.lastimport.wos2024-04-09T23:29:48Z
dc.abstract.enThe widespread use of PbTe nanocomposites requires knowledge regarding the composition of their grain boundaries. Cathodoluminescence (CL), TOF-SIMS and Rutherford backscattering spectroscopy (RBS) were used to explore the composition of surface layers formed via thermal, electrochemical, and wet chemical oxidation of lead telluride. Surface layers obtained by these methods contained components with different degrees of oxidation. RBS and CL results show that thermal and anodic oxidation produced ternary PbTeO_{3} and Pb_{2}TeO_{4} oxides, respectively. For the chemical oxide we observed a substantially lower concentration of oxygen described by PbO_{1-x}TeO_{2-x}, a significant amount of non-oxidized PbTe ions detected by SIMS, and low CL stability under electron beam radiation. Thus, the chemical oxide is likely a mixture of binary suboxides.pl
dc.affiliationWydział Fizyki, Astronomii i Informatyki Stosowanej : Instytut Fizyki im. Mariana Smoluchowskiegopl
dc.contributor.authorBerchenko, Nicolaspl
dc.contributor.authorSavchyn, Volodymyrpl
dc.contributor.authorFadeev, Sergeypl
dc.contributor.authorAfonin,Olegpl
dc.contributor.authorRysz, Jakub - 131755 pl
dc.contributor.authorTrzyna, Malgorzatapl
dc.contributor.authorCebulski, Józefpl
dc.date.accessioned2015-05-19T11:44:04Z
dc.date.available2015-05-19T11:44:04Z
dc.date.issued2014pl
dc.description.physical20-25pl
dc.description.volume21pl
dc.identifier.doi10.1016/j.mssp.2013.12.033pl
dc.identifier.eissn1873-4081pl
dc.identifier.issn1369-8001pl
dc.identifier.urihttp://ruj.uj.edu.pl/xmlui/handle/item/7441
dc.languageengpl
dc.language.containerengpl
dc.rightsDodaję tylko opis bibliograficzny*
dc.rights.licencebez licencji
dc.rights.uri*
dc.subject.enIV–VI semiconductor compoundspl
dc.subject.enoxide coatingpl
dc.subject.enternary lead–tellurium oxidespl
dc.subject.enPb^{2+} intracenter luminescencepl
dc.subject.enTOF-SIMSpl
dc.subject.enRutherford backscattering spectroscopypl
dc.subtypeArticlepl
dc.titleComposition of PbTe oxides obtained by different methodspl
dc.title.journalMaterials Science in Semiconductor Processingpl
dc.typeJournalArticlepl
dspace.entity.typePublication
cris.lastimport.wos
2024-04-09T23:29:48Z
dc.abstract.enpl
The widespread use of PbTe nanocomposites requires knowledge regarding the composition of their grain boundaries. Cathodoluminescence (CL), TOF-SIMS and Rutherford backscattering spectroscopy (RBS) were used to explore the composition of surface layers formed via thermal, electrochemical, and wet chemical oxidation of lead telluride. Surface layers obtained by these methods contained components with different degrees of oxidation. RBS and CL results show that thermal and anodic oxidation produced ternary PbTeO_{3} and Pb_{2}TeO_{4} oxides, respectively. For the chemical oxide we observed a substantially lower concentration of oxygen described by PbO_{1-x}TeO_{2-x}, a significant amount of non-oxidized PbTe ions detected by SIMS, and low CL stability under electron beam radiation. Thus, the chemical oxide is likely a mixture of binary suboxides.
dc.affiliationpl
Wydział Fizyki, Astronomii i Informatyki Stosowanej : Instytut Fizyki im. Mariana Smoluchowskiego
dc.contributor.authorpl
Berchenko, Nicolas
dc.contributor.authorpl
Savchyn, Volodymyr
dc.contributor.authorpl
Fadeev, Sergey
dc.contributor.authorpl
Afonin,Oleg
dc.contributor.authorpl
Rysz, Jakub - 131755
dc.contributor.authorpl
Trzyna, Malgorzata
dc.contributor.authorpl
Cebulski, Józef
dc.date.accessioned
2015-05-19T11:44:04Z
dc.date.available
2015-05-19T11:44:04Z
dc.date.issuedpl
2014
dc.description.physicalpl
20-25
dc.description.volumepl
21
dc.identifier.doipl
10.1016/j.mssp.2013.12.033
dc.identifier.eissnpl
1873-4081
dc.identifier.issnpl
1369-8001
dc.identifier.uri
http://ruj.uj.edu.pl/xmlui/handle/item/7441
dc.languagepl
eng
dc.language.containerpl
eng
dc.rights*
Dodaję tylko opis bibliograficzny
dc.rights.licence
bez licencji
dc.rights.uri*
dc.subject.enpl
IV–VI semiconductor compounds
dc.subject.enpl
oxide coating
dc.subject.enpl
ternary lead–tellurium oxides
dc.subject.enpl
Pb^{2+} intracenter luminescence
dc.subject.enpl
TOF-SIMS
dc.subject.enpl
Rutherford backscattering spectroscopy
dc.subtypepl
Article
dc.titlepl
Composition of PbTe oxides obtained by different methods
dc.title.journalpl
Materials Science in Semiconductor Processing
dc.typepl
JournalArticle
dspace.entity.type
Publication

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