Far-infrared reflectivity as a probe of point defects in Zn- and Cd-doped HgTe

2008
journal article
article
17
cris.lastimport.wos2024-04-10T03:17:13Z
dc.affiliationWydział Fizyki, Astronomii i Informatyki Stosowanej : Instytut Fizyki im. Mariana Smoluchowskiegopl
dc.contributor.authorCebulski, J.pl
dc.contributor.authorSheregii, E. M.pl
dc.contributor.authorPolit, J.pl
dc.contributor.authorMarcelli, A.pl
dc.contributor.authorPiccinini, M.pl
dc.contributor.authorKisiel, Andrzej - 363378 pl
dc.contributor.authorKucherenko, I. V.pl
dc.contributor.authorTriboulet, R.pl
dc.date.accessioned2021-01-07T14:26:44Z
dc.date.available2021-01-07T14:26:44Z
dc.date.issued2008pl
dc.description.number12pl
dc.description.volume92pl
dc.identifier.articleid121904pl
dc.identifier.doi10.1063/1.2902175pl
dc.identifier.eissn1520-8842pl
dc.identifier.eissn1520-8842pl
dc.identifier.issn0003-6951pl
dc.identifier.projectROD UJ / Opl
dc.identifier.urihttps://ruj.uj.edu.pl/xmlui/handle/item/259853
dc.languageengpl
dc.language.containerengpl
dc.rightsDodaję tylko opis bibliograficzny*
dc.rights.licencebez licencji
dc.rights.uri*
dc.subtypeArticlepl
dc.titleFar-infrared reflectivity as a probe of point defects in Zn- and Cd-doped HgTepl
dc.title.journalApplied Physics Letterspl
dc.typeJournalArticlepl
dspace.entity.typePublication
cris.lastimport.wos
2024-04-10T03:17:13Z
dc.affiliationpl
Wydział Fizyki, Astronomii i Informatyki Stosowanej : Instytut Fizyki im. Mariana Smoluchowskiego
dc.contributor.authorpl
Cebulski, J.
dc.contributor.authorpl
Sheregii, E. M.
dc.contributor.authorpl
Polit, J.
dc.contributor.authorpl
Marcelli, A.
dc.contributor.authorpl
Piccinini, M.
dc.contributor.authorpl
Kisiel, Andrzej - 363378
dc.contributor.authorpl
Kucherenko, I. V.
dc.contributor.authorpl
Triboulet, R.
dc.date.accessioned
2021-01-07T14:26:44Z
dc.date.available
2021-01-07T14:26:44Z
dc.date.issuedpl
2008
dc.description.numberpl
12
dc.description.volumepl
92
dc.identifier.articleidpl
121904
dc.identifier.doipl
10.1063/1.2902175
dc.identifier.eissnpl
1520-8842
dc.identifier.eissnpl
1520-8842
dc.identifier.issnpl
0003-6951
dc.identifier.projectpl
ROD UJ / O
dc.identifier.uri
https://ruj.uj.edu.pl/xmlui/handle/item/259853
dc.languagepl
eng
dc.language.containerpl
eng
dc.rights*
Dodaję tylko opis bibliograficzny
dc.rights.licence
bez licencji
dc.rights.uri*
dc.subtypepl
Article
dc.titlepl
Far-infrared reflectivity as a probe of point defects in Zn- and Cd-doped HgTe
dc.title.journalpl
Applied Physics Letters
dc.typepl
JournalArticle
dspace.entity.type
Publication
Affiliations

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