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ToF-SIMS application in the visualization and analysis of fingerprints after contact with amphetamine drugs

2009
journal article
article
10.1016/j.forsciint.2008.11.003
Journal
Forensic Science International
Author
Szynkowska Małgorzata I.

Czerski K.

Rogowski Jacek

Paryjczak Tadeusz

Parczewski Andrzej
Volume
184
Issue
1-3
Pages
e24-e26
ISSN
0379-0738
eISSN
1872-6283
Keywords in English

secondary ion mass spectrometry

fingerprints

drugs

forensic research

images

Remarks
Bibliogr. s. e26.
Language
English
Container language
English
Affiliation
Wydział Chemii : Zakład Chemii Analitycznej
cris.lastimport.wos2024-04-09T21:34:10Z
dc.affiliationWydział Chemii : Zakład Chemii Analitycznejpl
dc.contributor.authorSzynkowska, Małgorzata I.pl
dc.contributor.authorCzerski, K.pl
dc.contributor.authorRogowski, Jacekpl
dc.contributor.authorParyjczak, Tadeuszpl
dc.contributor.authorParczewski, Andrzej - 131278 pl
dc.date.accessioned2019-06-26T08:20:58Z
dc.date.available2019-06-26T08:20:58Z
dc.date.issued2009pl
dc.description.additionalBibliogr. s. e26.pl
dc.description.number1-3pl
dc.description.physicale24-e26pl
dc.description.volume184pl
dc.identifier.doi10.1016/j.forsciint.2008.11.003pl
dc.identifier.eissn1872-6283pl
dc.identifier.issn0379-0738pl
dc.identifier.projectROD UJ / Opl
dc.identifier.urihttps://ruj.uj.edu.pl/xmlui/handle/item/77999
dc.languageengpl
dc.language.containerengpl
dc.rightsDodaję tylko opis bibliograficzny*
dc.rights.licencebez licencji
dc.rights.uri*
dc.subject.ensecondary ion mass spectrometrypl
dc.subject.enfingerprintspl
dc.subject.endrugspl
dc.subject.enforensic researchpl
dc.subject.enimagespl
dc.subtypeArticlepl
dc.titleToF-SIMS application in the visualization and analysis of fingerprints after contact with amphetamine drugspl
dc.title.journalForensic Science Internationalpl
dc.typeJournalArticlepl
dspace.entity.typePublication
Affiliations
No affiliation
Szynkowska, Małgorzata I.
Czerski, K.
Rogowski, Jacek
Paryjczak, Tadeusz
Parczewski, Andrzej

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