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Optimization of low-background alpha spectrometers for analysis of thick samples
Journal
Applied Radiation and Isotopes
25
Author
Misiaszek Marcin
Pelczar Krzysztof
Wójcik Marcin
Zuzel Grzegorz
Laubenstein M.
Title of volume
6th International Conference on Radionuclide Metrology - Low Level Radioactivity Measurement Techniques
Volume
81
Pages
146-150
ISSN
0969-8043
eISSN
1872-9800
Keywords in English
alpha spectroscopy
thick samples
surface screening
low-background measurements
Language
English
Container language
English
Affiliation
Wydział Fizyki, Astronomii i Informatyki Stosowanej : Instytut Fizyki im. Mariana Smoluchowskiego
| dc.affiliation | Wydział Fizyki, Astronomii i Informatyki Stosowanej : Instytut Fizyki im. Mariana Smoluchowskiego | pl |
| dc.contributor.author | Misiaszek, Marcin - 173735 | pl |
| dc.contributor.author | Pelczar, Krzysztof - 103639 | pl |
| dc.contributor.author | Wójcik, Marcin - 100062 | pl |
| dc.contributor.author | Zuzel, Grzegorz - 186344 | pl |
| dc.contributor.author | Laubenstein, M. | pl |
| dc.date.accessioned | 2015-06-30T15:14:16Z | |
| dc.date.available | 2015-06-30T15:14:16Z | |
| dc.date.issued | 2013 | pl |
| dc.description.physical | 146-150 | pl |
| dc.description.volume | 81 | pl |
| dc.identifier.doi | 10.1016/j.apradiso.2013.03.006 | pl |
| dc.identifier.eissn | 1872-9800 | pl |
| dc.identifier.issn | 0969-8043 | pl |
| dc.identifier.uri | http://ruj.uj.edu.pl/xmlui/handle/item/10836 | |
| dc.language | eng | pl |
| dc.language.container | eng | pl |
| dc.rights | Dodaję tylko opis bibliograficzny | * |
| dc.rights.licence | bez licencji | |
| dc.rights.uri | * | |
| dc.subject.en | alpha spectroscopy | pl |
| dc.subject.en | thick samples | pl |
| dc.subject.en | surface screening | pl |
| dc.subject.en | low-background measurements | pl |
| dc.subtype | Article | pl |
| dc.title | Optimization of low-background alpha spectrometers for analysis of thick samples | pl |
| dc.title.journal | Applied Radiation and Isotopes | pl |
| dc.title.volume | 6th International Conference on Radionuclide Metrology - Low Level Radioactivity Measurement Techniques | pl |
| dc.type | JournalArticle | pl |
| dspace.entity.type | Publication |
dc.affiliationpl
Wydział Fizyki, Astronomii i Informatyki Stosowanej : Instytut Fizyki im. Mariana Smoluchowskiego dc.contributor.authorpl
Misiaszek, Marcin - 173735 dc.contributor.authorpl
Pelczar, Krzysztof - 103639 dc.contributor.authorpl
Wójcik, Marcin - 100062 dc.contributor.authorpl
Zuzel, Grzegorz - 186344 dc.contributor.authorpl
Laubenstein, M. dc.date.accessioned
2015-06-30T15:14:16Z dc.date.available
2015-06-30T15:14:16Z dc.date.issuedpl
2013 dc.description.physicalpl
146-150 dc.description.volumepl
81 dc.identifier.doipl
10.1016/j.apradiso.2013.03.006 dc.identifier.eissnpl
1872-9800 dc.identifier.issnpl
0969-8043 dc.identifier.uri
http://ruj.uj.edu.pl/xmlui/handle/item/10836 dc.languagepl
eng dc.language.containerpl
eng dc.rights*
Dodaję tylko opis bibliograficzny dc.rights.licence
bez licencji dc.rights.uri*
dc.subject.enpl
alpha spectroscopy dc.subject.enpl
thick samples dc.subject.enpl
surface screening dc.subject.enpl
low-background measurements dc.subtypepl
Article dc.titlepl
Optimization of low-background alpha spectrometers for analysis of thick samples dc.title.journalpl
Applied Radiation and Isotopes dc.title.volumepl
6th International Conference on Radionuclide Metrology - Low Level Radioactivity Measurement Techniques dc.typepl
JournalArticle dspace.entity.type
Publication