The present work investigates the possibility of bias introduced in grazing- incidence-angle X-ray diffraction techniques applied to residual stress measurements. In these studies, monotextured nanocrystalline nickel coatings obtained by electrodeposition were examined as the model reference samples. Selected Ni coatings exhibited well developed and simple gradient-free residual stress states that were visible using conventional sin 2 measurements with varying X-ray penetration depths. These results were verified against the stress state picture obtained by two variants of grazing-incidence X-ray methods: multi-reflection (different hkl ) and constant angle of incidence (single hkl ). The outcome of both grazing techniques consistently excluded stress gradients in the samples, which agreed with conventional sin 2 measurement results. However, only the results of the constant angle of incidence technique agreed with those obtained by the sin 2 method in terms of calculated residual stress level, suggesting this approach could be applied in further studies of graded material coatings. All analysed coatings yielded uniformly distributed tensile residual stress related to gradual structure development in electrodeposited Ni coatings studied by electron microscopy techniques