Cluster bombardments of 15 keV C_{60} on metal–organic interfaces composed of silver atoms and octatetraene molecules were modeled using molecular dynamics computer simulations. Dynamics revealed by the simulations include the formation of holes in the metal overlayers from which underlying organic molecules are sputtered predominantly by a rapid jetlike motion and the implantation of metal atoms and clusters in the underlying organic solid. Both of these processes negatively affect the information depth for cluster bombardment of metal–organic interfaces; therefore, the simulations presented here give a clear picture of the issues associated with depth profiling through metal–organic interfaces.